报告题目：Beyond Imaging: The Role of Atom Probe Tomography inMicrostructure Characterization and Analysis
报告人：Dr. Florian Vogel (Associate Professor)（South China University of Technology (SCUT)）
邀请人：韩宇教授
报告时间：2026年1月6日（星期二）14：30
报告地址：广州国际校区C2-a201会议室
Short Bio (English):
Florian Vogel is a German materialsscientist and currently an Associate Professor at South China University ofTechnology (SCUT). His research focuses on atomic-scale phase transformationphysics and the role of interfacial energetics in complex alloy systems. Hespecializes in advanced microscopy and microanalysis, including atom probetomography (APT), TEM, FIB/SEM, EBSD, combined with thermodynamic modeling tostudy multicomponent high-temperature alloys and high-entropy alloys.
He is an expert in APT withextensive experience analyzing a wide range of materials systems, includingstructural alloys, thin films, ceramics, geological samples, and semiconductormaterials.
Dr. Vogel has publishedextensively, including papers in Nature Communications, ActaMaterialia, JMST, and Materials & Design, with 18 first-or corresponding-author publications. He has led 11 national and provincialresearch projects, including the NSFC Foreign Young and Excellent YoungScientist programs.
Before joining SCUT, he heldfaculty positions at Hainan University and Jinan University, and previouslyserved as head of the Atom Probe Laboratory at TU Berlin. He also conductedpostdoctoral research at the University of Alabama and TU Berlin. His current work aims to unravelhierarchical microstructure evolution and interfacial segregation mechanisms inhigh-temperature alloys and to develop compositionally efficient alloy-designstrategies for next-generation structural materials. He is also an activemember of the International Field Emission Society (IFES), the ChineseCommittee on Ion and Atom Probe Technology and the Committee onThree-Dimensional Atomic Probes within the Chinese Society of Stereology.
Abstract：
Atom Probe Tomography (APT) is a cutting-edgetechnique offering profound insights into material microstructures at thenanoscale, combining near atomic resolution with 3D nanoscale chemicalanalysis. This concise workshop provides an overview of APT's principles,sample preparation, material analysis, and advanced data techniques.
The initial part covers APT basics,including field evaporation and Focused Ion Beam (FIB) sample preparation.Strategies for achieving high-resolution 3D imaging and successful samplepreparation across various materials are introduced.
The workshop navigates runningdiverse materials in an APT instrument, considering crystal structures andconductivity's impact on analysis outcomes. Strategies for optimizing APTanalysis across material types will be highlighted.
The latter part explores advancedAPT data reconstruction, calibration, and analysis methods. Reconstructionalgorithms, the importance of calibrating a reconstruction for precise mapping,and error rectification in compositional analysis. Methods for precipitatecharacterization, like 2D concentration mapping and spatial distributionmapping (SDM) analysis, will be presented.
This condensed workshop aims toprovide foundational APT knowledge, enabling attendees to conduct detailedinvestigations into material microstructures. Real-world applications and casestudies underscore APT's significance in material science, fostering innovativeresearch prospects.
电子显微中心
2026.1.1