October 30, Dr. Yuan Biao, a postdoctoral researcher at Center for Electron Microscopy of South China University of Technology, and Professor Han Yu, in collaboration with domestic and international teams, published Atomic-scale imaging of edge and defect structures in hybrid perovskite under ultralow electron dose on the top journal Nature.

Using truly high-speed ultralow-dose four-dimensional scanning transmission electron microscopy with dose fractionation, we perform ptychography at, to our knowledge, the lowest-dose atomic resolution to date, revealing not only the detailed atomic structure of the edges of a halide perovskite but also their structural dynamics. A majority methylammonium (MA) and iodine (I) edge termination is observed in methylammonium lead iodide (MAPbI3), and the damage rate of its edges and internal defects is found to depend on the concentration and type of vacancies present, with a preponderance of I vacancies in particular correlating with higher rates of damage.

Source：SCUT News

Translated by Chen Wanmei

Reviewed by AN Yufan