On October 20, 2023, the 23rd IEEE International Conference on Communication Technology, hosted by the IEEE (Institute of Electrical and Electronics Engineers), commenced in Wuxi, Jiangsu Province. A paper from Professor Tang Jianhua's team at our institute, titled EdgeFD: An Edge-Friendly Drift-Aware Fault Diagnosis System for Industrial IoT, was awarded the conference's Best Paper. The first author of the paper is Chen Jiao, a 2021 Ph.D. student from our institute.
Focusing on mechanical fault diagnosis in the industrial field, the EdgeFD framework introduced in this paper is an edge computing-based mechanical fault diagnosis system. It not only efficiently addresses the issues brought by data fluctuation (also known as data drift) but also successfully turns the concept of real-time mechanical fault detection into reality, creating a system demonstration and laying the foundation for industrial applications. The introduction of the EdgeFD framework not only meets the industry's demand for real-time and accurate mechanical fault diagnosis but also provides a solution to the long-standing challenge of data drift in the field.
The IEEE International Conference on Communication Technology (IEEE ICCT), initiated in 1986 and successfully held for 23 editions in various locations, is an important international event in the field of information and communication technology research. With the theme Modern Communication and the Internet of Things for this edition, the conference received 638 paper submissions. Distinguished scholars such as Hikmet Sari, European Academy of Sciences and Professor at Nanjing University of Posts and Telecommunications, Lu Jianhua, Academician of the Chinese Academy of Sciences and Professor at Tsinghua University, Yin Hao, Researcher at the Systems Engineering Research Institute of the Military Science Academy, and Cui Tiejun, Academician of the Chinese Academy of Sciences and Director of the National Key Laboratory of Millimeter Waves at Southeast University, attended the conference. (Photo and article by the SHIEN-MING WU School of Intelligent Engineering)