标题
作者
作者:Zheng, ZJ (Zheng, Z. J.)[2,1 ]; Gao, Y (Gao, Y.)[3,1 ]; Gui, Y (Gui, Y.)[1 ]; Zhu, M (Zhu, M.)[3,1 ]
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文献类型:Article
摘要
The fine microstructure of the passive films on nanocrystalline (NC) and coarse crystalline (CC) 304 stainless steels (SSs) in 0.5 M H2SO4 were investigated by electrochemical impedance spectroscopy (EIS), X-ray photoelectron spectroscopy (XPS), and atomic force microscopy (AFM). The results indicate that the passive film on both CC and NC SSs exhibits a two-layer microstructure consisting of a compact inner layer and a porous outer layer. Some hydrated compounds (HC) were present in the porous outer layer of NC SS but not CC SS in 0.5 M H2SO4 solution. The pores in the outer layer of the NC SS were observed to be in the nanoscale by AFM. HC filling of the pores in the passive film on NC SS may occur due to capillary forces endowed by the nanosize pores. XPS analysis of the passive films on both CC and NC SSs, however, does not show such a composition difference which is attributed to dehydration occurring in the XPS vacuum chamber. Both the inner and outer layers of the NC SS were determined by EIS analysis to be more compact and protective than the corresponding films on CC SS as evidenced by the lower Q value, higher n, and much higher R value in the corresponding layer.
关键词
作者关键词:Stainless steel; EIS; Passive film; Microstructure
作者信息
通讯作者地址:Gao, Y (通讯作者)
| Key Lab Adv Energy Storage Mat Guangdong Prov, Guangzhou, Guangdong, Peoples R China. |
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电子邮件地址:meygao@scut.edu.cn
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类别分类
研究方向:Electrochemistry
Web of Science 类别:Electrochemistry