On the afternoon of March 12, 2026, the Smart Future Corporate Research Frontier Lecture Series, organized by the Graduate Student Union of the School of Mechanical and Automotive Engineering, was held in Room F3-d120 at the Guangzhou International Campus of South China University of Technology.

The event specially invited Mr. Fu Guo, Vice President of Acroview Technology, as the keynote speaker.

Focusing on the semiconductor testing industry, Mr. Fu delivered an in-depth presentation titled Semiconductor Testing and Programming Technologies in the AI Era.

Drawing on his extensive experience at global industry leaders such as Texas Instruments (TI) and NXP, he systematically analyzed key technical pain points and future trends in the industry.

His clear, engaging, and humorous presentation made complex semiconductor concepts feel vivid and accessible, and the students responded with great enthusiasm.