讲座预告 | 南非自由州大学Hendrik C. Swart教授：The use of surface characterization techniques in phosphor materials
报告题目：The use of surface characterization techniques in phosphor materials
报 告 人：Hendrik C. Swart教授（南非自由州大学）
邀 请 人：夏志国 教授
报告时间：2026年6月11日（周四）上午10:00-11:00
报告地点：科技园1号楼501学术报告厅
报告摘要：
Surface characterization and optical characterization techniques play a vital role in the complete understanding of the luminescent properties of phosphor nanomaterials. Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), time-of-flight scanning ion mass spectrometry (TOF-SIMS), Photoluminescence (PL), and cathodoluminescence (CL) are used to characterize different phosphor materials. The crystal field, determined by the host material's environment, in combination with the various dopant ions in their correct valence states, can be used to obtain emissions from the Ultraviolet (UV) to the infrared (IR) wavelength ranges. Phosphor materials have been successfully used to improve the efficiency of various applications. Nanoparticles, both undoped and doped with various rare-earth elements, were synthesized using several techniques. The defects incorporated into the bulk material play an important role in the emission efficiency and colour scheme. XPS in combination with PL can be used to identify some of these defects in the material. Degradation of the different phosphors during prolonged electron/photon bombardment also played a vital role in their possible applications. The combination of CL, PL, AES, and XPS techniques helps to determine the mechanisms behind the degradation. A small number of impurities in the chemicals used during synthesis can play a large role in the final emission intensity and colour of the phosphor materials. TOF-SIMS can detect these impurities. Examples of different phosphor materials with different applications, such as Solid-State Lighting, will be shown. Furthermore, visualizing latent fingerprints (LFPs) with conventional powders has been challenging on multicolor surfaces. However, these challenges are addressed by the advent of fluorescent powders for LFP detection, which have redefined the effectiveness of the powder-dusting method. The potential of lanthanide-doped oxyfluoride nanophosphors as multifunctional materials for remote luminescence thermometry will be pointed out.
报告人简介：
Hendrik C Swart is a distinguished senior professor of Physics at the University of the Free State and a B1 NRF-rated internationally acclaimed researcher. In 1996, following a productive sabbatical at the University of Florida, he pioneered luminescent materials research in South Africa, laying a solid foundation for the country’s development in this field. His core research focuses on phosphor degradation for field-emission displays, nanosolid-state lighting, and semiconductor nanoparticle thin film synthesis, greatly optimizing display color, luminescence intensity and service life. He has founded a leading national luminescent materials research group and driven the development of related research teams across South Africa.
Professor Swart has outstanding academic achievements, with an ISI H-index of 68 and a Scopus H-index of 72, alongside a Google Scholar H-index of 80. He is among the top 0.05% of global scholars, ranking 7th worldwide in phosphors for lifetime contributions and 5th in the past five years. He serves on the editorial boards of multiple high-impact journals （‘Critical Reviews in Solid State and Materials Sciences” (IF-8.9) and Applied Surface Science Advances (IF-8.7)） and acts as a reviewer for over 100 academic publications. Holding a SARChI national research chair (renewed three times), he founded the National Nano Surface Characterization Facility. He has successfully supervised over 110 postgraduate students, with 20 ongoing. He has received numerous prestigious national research, mentorship and academic awards, and was listed among South Africa’s 300 Most Influential Leaders in 2025.
Hendrik C Swart是自由州大学的杰出资深物理学教授，也是一位获得南非国家研究基金会（NRF）B1级评定的国际知名研究人员。1996年，他率先在南非开展了发光材料研究，为该领域的发展奠定了坚实基础。他的核心研究聚焦于场发射显示器用荧光粉降解、纳米固态照明以及半导体纳米粒子薄膜合成。他拥有卓越的学术成就，其ISI H指数为68，Scopus H指数为72，Google Scholar H指数为80。他跻身全球学者前0.05%之列，他担任多家高影响力期刊的编委会成员（包括《固态与材料科学批判性评论》（影响因子8.9）和《应用表面科学进展》（影响因子8.7）），并为100余种学术刊物担任审稿人。作为SARChI国家研究主席（已三度连任），他创立了国家纳米表面表征中心。他已成功指导110余名研究生，目前另有20名研究生正在攻读学位。他荣获多项国家级研究、导师及学术奖项，并入选2025年南非“300位最具影响力领袖”榜单。
