关于举行北卡罗莱纳州立大学马伟博士后学术报告的通知
2014-05-19
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关于举行北卡罗莱纳州立大学
学术报告的通知
报告题目：Novel soft X-ray scattering experiments revealing how the undiscoveredstructure impacts the performance of organic solar cells
报告人：马伟博士后
时间2014年5月20日10:00
地点：国重大楼五楼会议室
摘要：The electronic and physical properties of soft/organic matter/materials are widely tunable and are often determined by their nano-to-mesoscale structure. The complex interplay between structure and these fundamental properties is applicable in a host of technologies and therefore important in many research areas. Unfortunately, such structure is particularly difficult to measure due to the low contrast with many traditional probes (X-rays, neutrons, or electrons) and low levels of molecular ordering. Recent advances in resonant soft X-ray techniques have opened new avenues to explore mesoscale physics in organic materials by probing the unique electronic orbitals in each molecule. I will discuss the work revealing the power of resonant X-rays to investigate complex hierarchical structureand molecular orientation of organic solar cells. With this new capability to look deep inside organic systems, we can now probe origins of emergent properties in functional organic materials, making possible their use in a new class of flexible electronics that could revolutionize how we use technology and embody an abundant and economically competitive source of renewable energy.
报告人简历: Dr. Wei Ma received his PhD degrees from the Universite Pierre et Marie Curie (UPMC) in 2010. He then moved to EcolenormaleSuperieure in Paris as ATER. From 2011, he worked with Prof. Ade (APS, AAAS fellow) in North Carolina State University as postdoc researcher. His research focused on morphology characterization of soft matters (organic electronics, block copolymer, bi-materials, etc). He has published papers on Nature Photonics, Adv. Mater., J. Am. Chem. Soc, Adv. Energy. Mater. etc. He was qualified the French MCF (faculty) in materials science and chemical physics fields in 2013. He is also the member of MRS, APS and SPIE.
