时间：2015年5月12日（星期二）下午15：00
地点：材料科学与工程学院8号楼201会议室

报告摘要：
       Reliability is the ability of a system to properly function, within specified performance limits, for a specified period of time, under the life cycle application conditions. Yet the urgency to deploy new technologies often leads to the systems being fielded with-out having first demonstrated adequate reliability. The same is true for other products and systems, ranging from consumer products, to computers, cars, airplanes and space vehicles.
       Systems with poor reliability are not only less likely to successfully carry out their intended missions, but they may also endanger lives. Deficient systems are also much more likely to require extra scheduled and unscheduled maintenance and to demand more spare and replacement parts over their life cycles. In addition, not finding fundamental flaws in a system’s design until after it is deployed can lead to costly program delays, expensive redesigns, and the imposition of operational constraints.
       In this address, Prof. Pecht, a participant on the National Academy of Science team that helped write some important reports, will present some of the key problems with design for reliability and reliability growth of electronics systems that have plagued organizations. Some of the recommendations given by the NAS committee will be discussed, but the topic will be expanded to include other recommendations based on the Center for Advanced Life Cycle Engineering’s (CALCE) success with both military and commercial industries.

附报告人简介：
       Prof Michael Pecht is a world renowned expert in strategic planning, design, test, and risk assessment of information systems. Prof Pecht has an MS in Electrical Engineering and an MS and PhD in Engineering Mechanics from the University of Wisconsin at Madison. He is a Professional Engineer, an IEEE Fellow, an ASME Fellow, an SAE Fellow and an IMAPS Fellow. He is the editor-in-chief of IEEE Access, and served as chief editor of the IEEE Transactions on Reliability for nine years, chief editor for Microelectronics Reliability for sixteen years. He is the founder and Director of CALCE (Center for Advanced Life Cycle Engineering) at the University of Maryland, which is funded by over 150 of the world’s leading electronics companies at more than US$6M/year. The CALCE Center received the NSF Innovation Award in 2009.  He is currently a Chair Professor in Mechanical Engineering and a Professor in Applied Mathematics at the University of Maryland. He has written more than twenty books on product reliability, development, use and supply chain management.  He has also written a series of books of the electronics industry in China, Korea, Japan and India. He consults for 22 international companies. He has written over 700 technical articles and has 7 patents. In 2013, he was awarded the University of Wisconsin-Madison’s College of Engineering Distinguished Achievement Award. In 2011, he received the University of Maryland’s Innovation Award for his new concepts in risk management. In 2010, he received the IEEE Exceptional Technical Achievement Award for his innovations in the area of prognostics and systems health management. In 2008, he was awarded the highest reliability honor, the IEEE Reliability Society’s Lifetime Achievement Award. He has previously received the European Micro and Nano-Reliability Award for outstanding contributions to reliability research, 3M Research Award for electronics packaging, and the IMAPS William D. Ashman Memorial Achievement Award for his contributions in electronics analysis.