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“Industrial edge intelligence: Federated-meta learning framework for few-shot fault diagnosis,” IEEE Trans. Net. Sci. Eng., revised. (JCR一区)
来源： 发布时间：2023-01-07
J. Chen, J. Tang*, and W. Li, “Industrial edge intelligence: Federated-meta learning framework for few-shot fault diagnosis,” IEEE Trans. Net. Sci. Eng., revised. (JCR一区)