Prof. Bin REN Shares The Latest Research on The Application of Spectral Technology

2019-01-04 ReadCount:10

Prof. Bin REN from Xiamen University was invited to our institute to give an academic lecture titled Nano-resolution Tip Enhanced Raman Spectroscopy and Its Application on Jan. 2nd. Prof. REN mentioned that tip enhanced Raman spectroscopy (TERS) technology which has nano-scale spatial resolution and detection sensitivity at the single-molecule level can provide surface morphology and chemical fingerprint information at the same time. This technology is a promising nano-characterization technology.

 Prof. Bin REN, Xiamen university

In his talk, Prof. REN introduced the basic principle, background and their latest results of TERS, including 1) Development of a new TERS technology based on AFM, which can be used to study the different 1D defects of molybdenum disulfide (MoS2) thin film and the Raman spectrum characteristics of these defects. 2) Development of electrochemical TERS to investigate the evolution of active edge sites during the process of hydrogen evolution.  3) Developed of the TERS technology based on STM to study electronic properties of catalysts on metallic surfaces.

Lecture on live

Prof. REN’s group focuses on the utilization and development of Raman spectroscopy and electrochemistry to study the physical and chemical processes on surfaces and in biological systems. In partlcular, they are interested in using surface plasmon based methods to obtain the molecular signatures of the above systems with improved sensitivity, including surface-enhanced Raman spectroscopy (SERS), tip enhanced Raman spectroscopy (TERS) and their combination with nanoelectrochemistry. Prof. Ren's talk has not only enlightened students to apply their knowledge with his personal experience, but also provide a good opportunity for broad interdisciplinary cooperation. 

Source from South China Advanced Institute for Soft Matter Science and Technology

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