Dr. Joachim Loos, chair professor of the School of Frontier Soft Matter, gave a short-term lecture
发布时间:2022-12-15   浏览次数:417

On December 7th and 14th, Dr. Joachim Loos, chair professor of the School of Frontier Soft Matter, gave a two-day online short-term lecture, giving an overview of the structure and performance characteristics of soft matter materials, especially printed electronics. Dr. Joachim Loos's practical case analysis and easy-to-understand lectures are very popular among students.

 

In the first session, Dr. Joachim Loos gave an overview of the past, present and potential future developments in printed electronics, especially applications in printed electronics based on functional small or macromolecules such as organic light-emitting diodes (OLEDs), organic photovoltaics ( OPV) or organic field-effect transistors (OFETs), as well as non-organic components such as transparent conductive oxide (TCO) layers or printed metal lines and contacts. He mentioned that the morphology of nanostructures, printed structures and devices is an important aspect in determining the performance of printed electronics. 

In the second lecture, Dr. Joachim Loos introduced a toolbox that can characterize at the nanoscale and provided several examples to demonstrate its versatility. Furthermore, several advanced methods to control morphology to tune or optimize device performance are introduced. Finally, examples of potential applications utilizing the integration of PE, OE, FE, StE, SE and traditional electronics, i.e. Hybrid Electronics (HE) and many more are highlighted. 

Dr. Joachim Loos is Chair Professor at the School of Frontier Soft Matter and founder of the consulting company Morphys (www.morphys.eu). He has a long-term professional accumulation in materials science and engineering, focusing on soft matter and polymer research. He has long been concerned with the structure-property relationship of materials. In addition, he has extensive experience in morphological characterization, especially high-resolution microscopy techniques such as scanning and transmission electron microscopy (SEM/TEM) and atomic force microscopy (AFM).


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