A lecture on transmission electron microscopy (TEM)
发布时间:2019-05-10   浏览次数:142

At the invitation of AISMST, Dr. Xianfeng Yang, a professorate senior engineer from Analytical and Testing Centre of South China of University of Technology, gave a lecture on transmission electron microscopy (TEM). The lecture includes four parts, the basic configuration and working principle of TEM, the sample preparation methods, common issues, and some application examples.  

Dr. Xianfeng Yang received his doctorate in the School of Chemistry and Chemical Engineerig of Sun Yat-Sen University in 2008, with his dissertation awarded as one of the “2010 Guangdong Outstanding Doctoral Dissertations”. Dr. Yang then pursued his scientific research at The Chinese University of Hong Kong, the Institute of Bioengineering and Nanotechnology of the Agency for Science, Technology and Research (A-Star) of Singapore, and the Hydro-Québec Research Institute of Canada, successively. As an expert in the synthesis and performance of inorganic nanostructure functional materials, He published a number of research articles in academic journals such as J. Am. Chem. Soc., ACS Nano, Chem. Mater., Nano Energy, etc, and been issued 8 Chinese invention patents. In 2014, he was invited to join the Analytical and Testing Center of South China University of Technology as a recruit of the Global Expert Plan. He now acts as the chief of the Micro-Analysis Office and is in charge of the TEM characterization of functional materials and the development of novel analytical instruments.

Transmission electron microscopy (TEM) makes use of various radiation signals generated during the transmission of electron beam  through the ultra-thin specimen for imaging and spectroscopic analysis. Being one of the most powerful tools for contemporary scientific research, this instrumentation provides atomic-resolution information of materials structure. Dr. Yang elucidated the TEM techniques in rich details with a plain and pellucid language, which received cordial praises from the students and faculty.

The newly installed 200 kV TEM in AISMST delivers a bright-field point resolution better than 0.2 nm. Equipped with 3D tomography module, high-angle annular dark-field detector, energy-dispersive X-ray spectrometer , and a cryo-holder, this instrument is an excellent platform for the TEM characterization of most soft matter materials. It is taken care of by dedicated professionals. Researchers are authorized to use it after comprehensive training and certification exams. 


South China Advanced Institute for Soft Matter Science and Technology. All Rights Reserved.
粤ICP备05084312号

Powered by Weicheng